IPNews® – Texas Instruments Inc. was granted a new patent on Tuesday covering a mode of measuring the performance of an array of solar energy panels with a range of sensors.
U.S. Patent Number 8,289,183, titled “System and method for solar panel array analysis,” describes a system and method for monitoring performance of one or more solar panels in a photovoltaic array, using a number of sensors configured to measure an output of individual solar panels. The system will allow greater efficiency in the operation and energy production of any given solar array, according to the patent description. To continue reading, click: TI Wins Patent For Method Of Keeping Tabs On Solar Panel Performance